Search Results for Dark field microscopy

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Metrology and diagnostic techniques for nanoelectronics

Ma, Zhiyong, 1950- editor.

T174.7

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Inspection: Past, Present, and Future -- 11.3.1 Dark-Field Inspection Technology -- 11.3.2 Bright-Field

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Trimetalic heterogeneous catalyst for dehydrogenation of formic acid with enhanced CO tolerance

Perşembe, Elif, author.

QD505 .P477 2017

Department of Chemistry : Submitted to The Graduate School of Engineering and Science of Bilkent University,

An electronic thesis accessible through the Institutional Repository; click for access

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-Angle Annular Dark Field (HAADF)/STEM. In addition, interaction of the catalyst surfaces with reactants and

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Handbook of Mathematical Methods in Imaging

Scherzer, Otmar. editor.

QA76.9 .M35

http://dx.doi.org/10.1007/978-1-4939-0790-8

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York,

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Light matter interaction in plexcitonic crystals and moiré cavities

Karademir, Ertuğrul.

QC176.8.P55 K37 2015

The Department of Physics : Graduate School of Engineering and Science of Bilkent University,

An electronic thesis accessible through the Institutional Repository; click for access

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can be confined. We show that we can directly image these modes using dark field microscopy. Further

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Synthesis of Zinc Oxide by Sol–Gel Method for Photoelectrochemical Cells

Alias, Siti Salwa. author.

TA1750 -1750.22

http://dx.doi.org/10.1007/978-981-4560-77-1

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-ray diffraction, field emission scanning electron microscopy, transmission electron microscopy, Fourier

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Transmission Electron Microscopy A Textbook for Materials Science

Williams, David B. author.

TA404.6

http://dx.doi.org/10.1007/978-0-387-76501-3

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Transmission Electron Microscopy A Textbook for Materials Science / Williams, David B. author.

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Methods in Plant Electron Microscopy and Cytochemistry

Dashek, William V. editor.

QK1 -989

http://dx.doi.org/10.1007/978-1-59259-232-6

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Methods in Plant Electron Microscopy and Cytochemistry Dashek, William V. editor.

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Impact of Electron and Scanning Probe Microscopy on Materials Research

Rickerby, David G. editor.

TA404.6

http://dx.doi.org/10.1007/978-94-011-4451-3

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Impact of Electron and Scanning Probe Microscopy on Materials Research Rickerby, David G. editor.

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Advances in the Crystallographic and Microstructural Analysis of Charge Density Wave Modulated Crystals

Boswell, Frank W. editor.

QD901 -999

http://dx.doi.org/10.1007/978-94-011-4603-6

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Excerpt:

. Selected Area Diffraction -- 3. Convergent Beam Diffraction -- 4. Satellite Dark Field Microscopy -- 5

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10.

Transmission Electron Microscopy A Textbook for Materials Science

Williams, David B. author.

QC450 -467

http://dx.doi.org/10.1007/978-1-4757-2519-3

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Transmission Electron Microscopy A Textbook for Materials Science / Williams, David B. author.

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11.

Geometry and Thermodynamics Common Problems of Quasi-Crystals, Liquid Crystals, and Incommensurate Systems

Tolédano, J.-C. editor.

QD146 -197

http://dx.doi.org/10.1007/978-1-4615-3816-5

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Proceedings of a NATO ARW held in Preveza, Greece, September 4-8, 1989

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12.

Chemistry and Physics of Solid Surfaces VI

Vanselow, Ralf. editor.

QC176.8 .S8

http://dx.doi.org/10.1007/978-3-642-82727-3

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Excerpt:

Field-Electron Emission Microscopy -- 13.3.1 Conceptual -- 13.3.2 The Microscopy -- a) The Microscope

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